Publications

Haystack publications across all research areas: astronomy, geodesy, geospace and atmospheric science, and space technology. Publications listed here each include at least one Haystack author.
2940 Results found

Scanning tunneling microscopy characterization of the geometric and electronic structure of hydrogen‐terminated silicon surfaces. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. (1988). DOI: https://doi.org/10.1116/1.575372

Matera laser collocation experiment. NASA STI/Recon Technical Report N. (1987). BIBCODE: https://ui.adsabs.harvard.edu/abs/1987STIN…8728003G

Gas Scintillators for Imaging of Low Energy Isotopes. IEEE Transactions on Nuclear Science. (1987). DOI: https://doi.org/10.1109/TNS.1987.4337372

Monte Carlo modeling of ionospheric oxygen acceleration by cyclotron resonance with broad-band electromagnetic turbulence. Physical Review Letters. (1987). DOI: https://doi.org/10.1103/PhysRevLett.59.148

Lower hybrid ion conics. IN: Physics of space plasmas (1985-7) (A88-51087 22-46). Cambridge. (1987). BIBCODE: https://ui.adsabs.harvard.edu/abs/1987pspp.book…55C

Physics of space plasmas (1985-7). (1987).

Radio Sources with Strong Jets and Weak Core. The Astronomical Journal. (1987). DOI: https://doi.org/10.1086/114582

The Penn State astronomical image processing system. Publications of the Astronomical Society of the Pacific. (1987). DOI: https://doi.org/10.1086/132017

The localization and crystallographic dependence of Si suboxide species at the SiO2/Si interface. Journal of Applied Physics. (1987). DOI: https://doi.org/10.1063/1.338215

The localization and crystallographic dependence of Si suboxide species at the SiO2/Si interface. Journal of Applied Physics. (1987). DOI: https://doi.org/10.1063/1.338215

The localization and crystallographic dependence of Si suboxide species at the SiO2/Si interface. Journal of Applied Physics. (1987). DOI: https://doi.org/10.1063/1.338215

The localization and crystallographic dependence of Si suboxide species at the SiO2/Si interface. Journal of Applied Physics. (1987). DOI: https://doi.org/10.1063/1.338215

The localization and crystallographic dependence of Si suboxide species at the SiO2/Si interface. Journal of Applied Physics. (1987). DOI: https://doi.org/10.1063/1.338215

The localization and crystallographic dependence of Si suboxide species at the SiO2/Si interface. Journal of Applied Physics. (1987). DOI: https://doi.org/10.1063/1.338215

The localization and crystallographic dependence of Si suboxide species at the SiO2/Si interface. Journal of Applied Physics. (1987). DOI: https://doi.org/10.1063/1.338215

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