Publications

Haystack publications across all research areas: astronomy, geodesy, geospace and atmospheric science, and space technology. Publications listed here each include at least one Haystack author.
2944 Results found

X-ray photoelectron spectroscopy study of the chemical structure of thermally nitrided SiO2. Applied Physics Letters. (1984). DOI: https://doi.org/10.1063/1.94614

Intrinsic surface binding energy shifts in Yb metal. Journal of Electron Spectroscopy and Related Phenomena. (1984). DOI: https://doi.org/10.1016/0368-2048(84)80048-1

Electron escape depth variation in thin SiO2 films measured with variable photon energy. Journal of Vacuum Science Technology. (1984). BIBCODE: https://ui.adsabs.harvard.edu/abs/1984JVST….2..584H

X-ray photoelectron spectroscopy study of the chemical structure of thermally nitrided SiO2. Applied Physics Letters. (1984). DOI: https://doi.org/10.1063/1.94614

Electron escape depth variation in thin SiO2 films measured with variable photon energy. Journal of Vacuum Science Technology. (1984). BIBCODE: https://ui.adsabs.harvard.edu/abs/1984JVST….2..584H

X-ray photoelectron spectroscopy study of the chemical structure of thermally nitrided SiO2. Applied Physics Letters. (1984). DOI: https://doi.org/10.1063/1.94614

Electron escape depth variation in thin SiO2 films measured with variable photon energy. Journal of Vacuum Science Technology. (1984). BIBCODE: https://ui.adsabs.harvard.edu/abs/1984JVST….2..584H

X-ray photoelectron spectroscopy study of the chemical structure of thermally nitrided SiO2. Applied Physics Letters. (1984). DOI: https://doi.org/10.1063/1.94614

Electron escape depth variation in thin SiO2 films measured with variable photon energy. Journal of Vacuum Science Technology. (1984). BIBCODE: https://ui.adsabs.harvard.edu/abs/1984JVST….2..584H

X-ray photoelectron spectroscopy study of the chemical structure of thermally nitrided SiO2. Applied Physics Letters. (1984). DOI: https://doi.org/10.1063/1.94614

Electron escape depth variation in thin SiO2 films measured with variable photon energy. Journal of Vacuum Science Technology. (1984). BIBCODE: https://ui.adsabs.harvard.edu/abs/1984JVST….2..584H

X-ray photoelectron spectroscopy study of the chemical structure of thermally nitrided SiO2. Applied Physics Letters. (1984). DOI: https://doi.org/10.1063/1.94614

Electron escape depth variation in thin SiO2 films measured with variable photon energy. Journal of Vacuum Science Technology. (1984). BIBCODE: https://ui.adsabs.harvard.edu/abs/1984JVST….2..584H

X-ray photoelectron spectroscopy study of the chemical structure of thermally nitrided SiO2. Applied Physics Letters. (1984). DOI: https://doi.org/10.1063/1.94614

Compact structure in the powerful distant radio source 4C 04.81.. Monthly Notices of the Royal Astronomical Society. (1983). DOI: https://doi.org/10.1093/mnras/205.2.395

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